A theme of this month’s column is education. Most of the sites I’ve covered this month have a strong educational component and Principle of Scanning Probe Microscopy is no exception. With content ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The first demonstration of an approach that inverts the standard paradigm of scanning probe microscopy raises the prospect of force sensing at the fundamental limit. The development of scanning probe ...

What is Scanning Electrochemical Microscopy? Scanning electrochemical microscopy (SECM) is a powerful analytical technique that combines the principles of electrochemistry and scanning probe ...

A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...