EDN

ATI 90nm Graphics MPU Leverages Embedded Deterministic Test

ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...
Semiconductor Engineering

In-System/In-Field Testing Using High-Quality Deterministic Test Patterns

The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

High-Quality Test And Embedded Analytics Are Vital For Secure SoCs

Applications such as smart cards and devices used in the defense industry require security features to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement ...
EDN

Advanced Test Part 2: New Design-For-Test Strategies Tackle Comms IC Changes

To view a PDF version of this article, click here. To maintain test quality, designers must continually update or replace their DFT techniques. While this applies across the board, DFT for ...