SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

The huge undertaking of verifying a system-on-chip (SoC) design has challenged engineers for more than 20 years –– the amount of time spent on it hasn’t varied much from between 50-70% of the entire ...

The International Electronics Manufacturing Initiative (iNEMI) consortium of companies has initiated three projects intended to help manufacturers improve the quality of printed-circuit boards (PCBs).

Advances in very deep-submicron process technology require corresponding investments in design and test. Design infrastructure enabling the achievements of advanced design capability is well ...