Classification and Localization of Semiconductor Defect Classes in Aggressive Pitches (imec, Screen)
A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...
HILLSBORO, Ore.--(BUSINESS WIRE)--Thermo Fisher Scientific, the world leader in serving science, has introduced the Thermo Scientific™ Meridian™ EX System— an electron-beam-based failure analysis ...
Single atomic defect is the smallest structural unit of solid material. The construction of devices based on single defect can reach the limit of miniaturization of semiconductor devices. In the past ...
The nProber IV provides greater levels of automation and precision for semiconductor yield engineers as they perform leading-edge and mid-range logic and memory failure analysis. Thermo Fisher ...
Micro-LED display driven with CuIn5Se8 transistors processed by solution deposition. The LEDs are inorganic making them hard to operate without the power available from devices made with the new ...
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